Mohapatra S.; Sahu P.K.; Rath S.; Sahoo P.K.; Varma S.; Narasimha Murty N.V.L.2025-02-1720205http://dx.doi.org/10.1016/j.spmi.2020.106504https://idr.iitbbs.ac.in/handle/2008/2888This work correlates the ultraviolet (UV) current response of single-crystal diamond photodetectors to the lifetimes of nitrogen-induced color centers. Single-crystal diamond photodetectors are fabricated and characterized by optical and electrical measurements. The optical characterizations include Raman spectroscopy, Photoluminescence spectroscopy (PL) and the Time Resolved Photoluminescence (TR-PL) measurements. The electrical characterizations include the capacitance-voltage (C�V), current-voltage (I�V), and UV response current measurements. As observed from the photocurrent studies, the magnitude of the current response rises up to five order in the voltage range �100V in comparison to the dark condition. The charge carrier dynamics of the dominant color centers contributing to the response have been analysed quantitatively through UV response, PL and TR-PL measurements. TR-PL studies reveal that the faster component of the decay can be associated with the Shockley Read Hall (SRH)- nonradiative recombination which decreases with the increase in nitrogen concentration. The decay period corresponding to the slower component is attributed to the radiative recombination at the color centers. � 2020 Elsevier LtdDefect characterization; Diamond detectors; Time resolved photoluminescence (TR-PL); Ultra-violet (UV) responseArticle