Design and Analysis of PVT Invariant Current Reference in 65-nm CMOS
dc.contributor.author | Maurya N.; Wary N. | en_US |
dc.date.accessioned | 2025-02-17T10:17:01Z | |
dc.date.issued | 2022 | |
dc.description.abstract | In this paper, a CMOS current reference circuit has been proposed for achieving a PVT compensated current. The design is based on a modified version of the beta multiplier circuit with an on-chip resistor implemented using transistor in the deep triode region. Compensation of process corner variation is done by using a process tracking circuit (PTC). Temperature variation compensation is achieved by cancelling the PTAT variation of the beta multiplier circuit with the CTAT gate voltage of the on-chip transistor based resistor. The design has been implemented in 65 nm CMOS technology and simulated in Cadence specter. The current reference achieves a process variation of 1.4% and it has a temperature coefficient of 276.8 ppm/ �C over a temperature range of 0�C to 100�C. The reference current generated in this design is 8.8 \mu A with a supply voltage of 1.2 V, giving a net power consumption 126.56 \mu W. � 2022 IEEE. | en_US |
dc.identifier.citation | 3 | en_US |
dc.identifier.uri | http://dx.doi.org/10.1109/MWSCAS54063.2022.9859372 | |
dc.identifier.uri | https://idr.iitbbs.ac.in/handle/2008/4230 | |
dc.language.iso | en | en_US |
dc.subject | CTAT; current reference; on-chip resistor; PCT; PTAT; PVT invariant | en_US |
dc.title | Design and Analysis of PVT Invariant Current Reference in 65-nm CMOS | en_US |
dc.type | Conference paper | en_US |