Measurement of the branching ratio of B0 ?d?+?- ? ? relative to B 0 ?d?+? ??? decays with a semileptonic tagging method

Sato Y.; Iijima T.; Adamczyk K.; Aihara H.; Asner D.M.; Atmacan H.; Aushev T.; Ayad R.; Aziz T.; Babu V.; Badhrees I.; Bakich A.M.; Bansal V.; Behera P.; Bhardwaj V.; Bhuyan B.; Biswal J.; Bonvicini G.; Bozek A.; Bra?ko M.; ?ervenkov D.; Chang P.; Chekelian V.; Chen A.; Cheon B.G.; Chilikin K.; Chistov R.; Cho K.; Chobanova V.; Choi Y.; Cinabro D.; Danilov M.; Dash N.; Di Carlo S.; Dole�al Z.; Dutta D.; Eidelman S.; Epifanov D.; Farhat H.; Fast J.E.; Ferber T.; Fulsom B.G.; Gaur V.; Gabyshev N.; Garmash A.; Goldenzweig P.; Golob B.; Greenwald D.; Hara K.; Hara T.; Hasenbusch J.; Hayasaka K.; Hayashii H.; Hirose S.; Horiguchi T.; Hou W.-S.; Inami K.; Ishikawa A.; Itoh R.; Iwasaki Y.; Jaegle I.; Jeon H.B.; Joffe D.; Julius T.; Kang K.H.; Kato Y.; Katrenko P.; Kawasaki T.; Kim D.Y.; Kim J.B.; Kim K.T.; Kim M.J.; Kim S.H.; Kim Y.J.; Kinoshita K.; Kody� P.; Korpar S.; Kotchetkov D.; Krokovny P.; Kuhr T.; Kumar R.; Kwon Y.-J.; Lange J.S.; Li C.H.; Li L.; Li Y.; Li Gioi L.; Libby J.; Liventsev D.; Luo T.; Masuda M.; Matsuda T.; Matvienko D.; Miyabayashi K.; Miyata H.; Mizuk R.; Mohanty G.B.; Moll A.; Moon H.K.; Nakamura K.R.; Nakano E.; Nakao M.; Nanut T.; Nath K.J.; Natkaniec Z.; Nayak M.; Negishi K.; Nisar N.K.; Nishida S.; Ogawa S.; Okuno S.; Olsen S.L.; Onuki Y.; Pakhlov P.; Pakhlova G.; Pal B.; Park C.-S.; Paul S.; Pedlar T.K.; Pes�ntez L.; Pestotnik R.; Petri? M.; Piilonen L.E.; Purohit M.V.; Rauch J.; Rostomyan A.; Rozanska M.; Sakai Y.; Sandilya S.; Santelj L.; Savinov V.; Schl�ter T.; Schneider O.; Schnell G.; Schwanda C.; Schwartz A.J.; Seino Y.; Senyo K.; Seon O.; Sevior M.E.; Shebalin V.; Shen C.P.; Shibata T.-A.; Shiu J.-G.; Shwartz B.; Simon F.; Solovieva E.; Stani? S.; Stari? M.; Strube J.F.; Sumiyoshi T.; Takizawa M.; Tamponi U.; Tenchini F.; Trabelsi K.; Uchida M.; Uno S.; Urquijo P.; Ushiroda Y.; Usov Y.; Van Hulse C.; Varner G.; Vinokurova A.; Vorobyev V.; Wang C.H.; Wang M.-Z.; Wang P.; Watanabe Y.; Williams K.M.; Won E.; Yamamoto H.; Yamaoka J.; Yamashita Y.; Yelton J.; Yook Y.; Yuan C.Z.; Yusa Y.; Zhang Z.P.; Zhilich V.; Zhukova V.; Zhulanov V.; Zupanc A.; Belle Collaboration

Measurement of the branching ratio of B0 ?d?+?- ? ? relative to B 0 ?d?+? ??? decays with a semileptonic tagging method

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2016

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We report a measurement of the ratio R(D?)=B(B0?D?+?-??)/B(B0?D?+?), where denotes an electron or a muon. The results are based on a data sample containing 772�106 BB pairs recorded at the (4S) resonance with the Belle detector at the KEKB e+e- collider. We select a sample of B0B0 pairs by reconstructing both B mesons in semileptonic decays to D? �. We measure R(D?)=0.302�0.030(stat)�0.011(syst), which is within 1.6? of the Standard Model theoretical expectation, where the standard deviation ? includes systematic uncertainties. We use this measurement to constrain several scenarios of new physics in a model-independent approach. � 2016 American Physical Society.

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174

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http://dx.doi.org/10.1103/PhysRevD.94.072007
https://idr.iitbbs.ac.in/handle/2008/943

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Measurement of the branching ratio of B0 ?d?+?- ? ? relative to B 0 ?d?+? ??? decays with a semileptonic tagging method

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