Guided-mode analysis of tamm-plasmon polariton at metal-heterostructure dielectric interface

Abstract

We present a comprehensive analysis for transverse electric (TE) and transverse magnetic (TM) polarized guided Tamm-plasmon polariton (TPP) mode at metal-heterostructure media interface. We explicitly show that the quarter-wavelength stack condition will not be satisfied for TE or TM polarized TPP mode due to the existence of null-point at metal-heterostructure media boundary. Therefore, we propose an alternate route to design TPP waveguide by solving the mode-dispersion relation for different geometrical parameters in a TiO2/SiO2 bilayer system. The guided TPP-modes (TE and TM) exhibit interesting dispersion characteristics which can be tailored as per the desired application. The group index of TM polarized TPP mode remains constant over a significant wavelength range which results into zero group-velocity dispersion (GVD) at ? ? 630 nm wavelength. Also, the propagation length for TM-polarized TPP modes vary between 25 to 50in a 630-650 nm wavelength range. However, the variation of GVD for TE-modes exhibit a monotonic variation with an exceptionally large GVD-3104 around =632.8. � 2014 IEEE.