A bonding study toward the quality assurance of Belle-II silicon vertex detector modules

dc.contributor.authorKang K.H.en_US
dc.contributor.authorJeon H.B.en_US
dc.contributor.authorPark H.en_US
dc.contributor.authorUozumi S.en_US
dc.contributor.authorAdamczyk K.en_US
dc.contributor.authorAihara H.en_US
dc.contributor.authorAngelini C.en_US
dc.contributor.authorAziz T.en_US
dc.contributor.authorBabu V.en_US
dc.contributor.authorBacher S.en_US
dc.contributor.authorBahinipati S.en_US
dc.contributor.authorBarberio E.en_US
dc.contributor.authorBaroncelli T.en_US
dc.contributor.authorBasith A.K.en_US
dc.contributor.authorBatignani G.en_US
dc.contributor.authorBauer A.en_US
dc.contributor.authorBehera P.K.en_US
dc.contributor.authorBergauer T.en_US
dc.contributor.authorBettarini S.en_US
dc.contributor.authorBhuyan B.en_US
dc.contributor.authorBilka T.en_US
dc.contributor.authorBosi F.en_US
dc.contributor.authorBosisio L.en_US
dc.contributor.authorBozek A.en_US
dc.contributor.authorBuchsteiner F.en_US
dc.contributor.authorCasarosa G.en_US
dc.contributor.authorCeccanti M.en_US
dc.contributor.author?ervenkov D.en_US
dc.contributor.authorChendvankar S.R.en_US
dc.contributor.authorDash N.en_US
dc.contributor.authorDivekar S.T.en_US
dc.contributor.authorDole�al Z.en_US
dc.contributor.authorDutta D.en_US
dc.contributor.authorForti F.en_US
dc.contributor.authorFriedl M.en_US
dc.contributor.authorHara K.en_US
dc.contributor.authorHiguchi T.en_US
dc.contributor.authorHoriguchi T.en_US
dc.contributor.authorIrmler C.en_US
dc.contributor.authorIshikawa A.en_US
dc.contributor.authorJoo C.W.en_US
dc.contributor.authorKandra J.en_US
dc.contributor.authorKato E.en_US
dc.contributor.authorKawasaki T.en_US
dc.contributor.authorKody� P.en_US
dc.contributor.authorKohriki T.en_US
dc.contributor.authorKoike S.en_US
dc.contributor.authorKolwalkar M.M.en_US
dc.contributor.authorKvasni?ka P.en_US
dc.contributor.authorLanceri L.en_US
dc.contributor.authorLettenbicher J.en_US
dc.contributor.authorMammini P.en_US
dc.contributor.authorMayekar S.N.en_US
dc.contributor.authorMohanty G.B.en_US
dc.contributor.authorMohanty S.en_US
dc.contributor.authorMorii T.en_US
dc.contributor.authorNakamura K.R.en_US
dc.contributor.authorNatkaniec Z.en_US
dc.contributor.authorNegishi K.en_US
dc.contributor.authorNisar N.K.en_US
dc.contributor.authorOnuki Y.en_US
dc.contributor.authorOstrowicz W.en_US
dc.contributor.authorPaladino A.en_US
dc.contributor.authorPaoloni E.en_US
dc.contributor.authorPilo F.en_US
dc.contributor.authorProfeti A.en_US
dc.contributor.authorRao K.K.en_US
dc.contributor.authorRashevskaia I.en_US
dc.contributor.authorRizzo G.en_US
dc.contributor.authorRozanska M.en_US
dc.contributor.authorSandilya S.en_US
dc.contributor.authorSasaki J.en_US
dc.contributor.authorSato N.en_US
dc.contributor.authorSchultschik S.en_US
dc.contributor.authorSchwanda C.en_US
dc.contributor.authorSeino Y.en_US
dc.contributor.authorShimizu N.en_US
dc.contributor.authorStypula J.en_US
dc.contributor.authorTanaka S.en_US
dc.contributor.authorTanida K.en_US
dc.contributor.authorTaylor G.N.en_US
dc.contributor.authorThalmeier R.en_US
dc.contributor.authorThomas R.en_US
dc.contributor.authorTsuboyama T.en_US
dc.contributor.authorUrquijo P.en_US
dc.contributor.authorVitale L.en_US
dc.contributor.authorVolpi M.en_US
dc.contributor.authorWatanuki S.en_US
dc.contributor.authorWatson I.J.en_US
dc.contributor.authorWebb J.en_US
dc.contributor.authorWiechczynski J.en_US
dc.contributor.authorWilliams S.en_US
dc.contributor.authorW�rkner B.en_US
dc.contributor.authorYamamoto H.en_US
dc.contributor.authorYin H.en_US
dc.contributor.authorYoshinobu T.en_US
dc.date.accessioned2025-02-17T05:36:40Z
dc.date.issued2016
dc.description.abstractA silicon vertex detector (SVD) for the Belle-II experiment comprises four layers of double-sided silicon strip detectors (DSSDs), assembled in a ladder-like structure. Each ladder module of the outermost SVD layer has four rectangular and one trapezoidal DSSDs supported by two carbon-fiber ribs. In order to achieve a good signal-to-noise ratio and minimize material budget, a novel chip-on-sensor �Origami� method has been employed for the three rectangular sensors that are sandwiched between the backward rectangular and forward (slanted) trapezoidal sensors. This paper describes the bonding procedures developed for making electrical connections between sensors and signal fan-out flex circuits (i.e., pitch adapters), and between pitch adapters and readout chips as well as the results in terms of the achieved bonding quality and pull force. � 2016 Elsevier B.V.en_US
dc.identifier.urihttp://dx.doi.org/10.1016/j.nima.2016.03.075
dc.identifier.urihttps://idr.iitbbs.ac.in/handle/2008/968
dc.language.isoenen_US
dc.subjectBelle-IIen_US
dc.subjectDSSDen_US
dc.subjectOrigamien_US
dc.subjectPitch adapteren_US
dc.subjectSVDen_US
dc.subjectWire bondingen_US
dc.titleA bonding study toward the quality assurance of Belle-II silicon vertex detector modulesen_US
dc.typeArticleen_US

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