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Please use this identifier to cite or link to this item: http://idr.iitbbs.ac.in/jspui/handle/2008/474
Title: Guided-mode analysis of tamm-plasmon polariton at metal-heterostructure dielectric interface
Authors: Das R.
Pandey A.
Srivastava T.
Jha R.
Keywords: Bragg reflection
Dispersion
Optical waveguides
Plasmons
Issue Date: 2014
Citation: 8
Abstract: We present a comprehensive analysis for transverse electric (TE) and transverse magnetic (TM) polarized guided Tamm-plasmon polariton (TPP) mode at metal-heterostructure media interface. We explicitly show that the quarter-wavelength stack condition will not be satisfied for TE or TM polarized TPP mode due to the existence of null-point at metal-heterostructure media boundary. Therefore, we propose an alternate route to design TPP waveguide by solving the mode-dispersion relation for different geometrical parameters in a TiO2/SiO2 bilayer system. The guided TPP-modes (TE and TM) exhibit interesting dispersion characteristics which can be tailored as per the desired application. The group index of TM polarized TPP mode remains constant over a significant wavelength range which results into zero group-velocity dispersion (GVD) at ? ? 630 nm wavelength. Also, the propagation length for TM-polarized TPP modes vary between 25 to 50in a 630-650 nm wavelength range. However, the variation of GVD for TE-modes exhibit a monotonic variation with an exceptionally large GVD-3104 around =632.8. � 2014 IEEE.
URI: http://dx.doi.org/1109/JLT.2014.2301154
http://10.10.32.48:8080/jspui/handle/2008/474
Appears in Collections:Research Publications

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